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Shenzhen Chuangxin Instrument Co., Ltd
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IEC60529/IEC60065 Sphere test probe A
| Place of Origin: | Guangdong, China (Mainland) |
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Product Detail
IEC60529/IEC60065 Sphere test probe A
IEC60529/IEC60065 Sphere test probe A
1.Application:
Test Sphere Probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code.Also used to verify protection from access with the back of the hand for an IP suffix A code.
It is strictly designed and manufactured according to IEC61032 IEC60529 IEC60065 standards and other similar international standards.
2.Technical parameter:
| Ball diameter | 50mm |
| Baffle plate diameter | 45mm |
| Baffle plate thickness | 4mm |
| Handle diameter | 10mm |
| Handle length | 100mm |
| Material | plastic(delrin) + stainless steel |
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Company Info
Shenzhen Chuangxin Instrument Co., Ltd [China (Mainland)]
Business Type:Manufacturer, Trading Company
City: Shenzhen
Province/State: Guangdong
Country/Region: China (Mainland)
